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Volumn 517, Issue 2, 2008, Pages 891-895

Transparent conducting aluminum-doped zinc oxide thin film prepared by sol-gel process followed by laser irradiation treatment

Author keywords

Laser annealing; Optical properties; Organic light emitting device; Scanning electron microscopy; Sol gel; Sol gel deposition; Transparent conductive oxide; X ray diffraction

Indexed keywords

ALUMINA; ANNEALING; COLLOIDS; EXCIMER LASERS; FILM PREPARATION; GAS LASERS; GELATION; GELS; IRRADIATION; KRYPTON; LASERS; LIGHT; MICROSCOPIC EXAMINATION; OPTICAL MATERIALS; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTICAL SYSTEMS; OXIDE FILMS; OXIDES; SOL-GELS; SOLS; THICK FILMS; ZINC; ZINC OXIDE;

EID: 55049115982     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.157     Document Type: Article
Times cited : (77)

References (23)
  • 18
    • 55049109052 scopus 로고    scopus 로고
    • Joint Committee on Power Diffraction Standards, Power Diffraction File, International Center for Diffraction Data, Swarthmore, PA, card 36-1451, 1988.
    • Joint Committee on Power Diffraction Standards, Power Diffraction File, International Center for Diffraction Data, Swarthmore, PA, card 36-1451, 1988.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.