Technical obstacles to thin film transistor circuits on plastic

Japanese Journal of Applied Physics

Volumn 47, Issue 6 PART 1, 2008, Pages 4430-4435

  Miyasaka, Mitsutoshi ^a   Hara, Hiroyuki ^a   Karaki, Nobuo ^a   Inoue, Satoshi ^a   Kawai, Hideyuki ^a   Nebashi, Satoshi ^a  

^a SEIKO EPSON CORPORATION   (Japan)

Author keywords

Durability; Flexible device; Joule's heat; Mechanical strain; Plastic; Scaling; Self heating; Thermal strain; Thin film transistor

Indexed keywords

ABS RESINS; BICMOS TECHNOLOGY; DURABILITY; ENERGY EFFICIENCY; HEATING; MICROELECTRONICS; PLASTICS; THICK FILMS; THIN FILM DEVICES; THIN FILM TRANSISTORS; THIN FILMS; TRANSISTORS; WIRELESS TELECOMMUNICATION SYSTEMS;

FLEXIBLE DEVICE; JOULE'S HEAT; MECHANICAL STRAIN; SCALING; SELF-HEATING; THERMAL STRAIN; THIN FILM TRANSISTOR;

THIN FILM CIRCUITS;

EID: 55049110465     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.4430     Document Type: Article

References (21)

1. T. Kodaira, S. Hirabayashi, Y. Komatsu, S. Utsunomiya, M. Miyasaka, H. Kawai, S. Nebashi, S. Inoue, T. Shimoda, T. Whitesides, S. Patry, and M. McCreary: Int. Display Workshop/Asia Display 05 Tech. Dig., 2005, Takamatsu, p. 869.
2. Y. Komatsu, H. Kawai. T. Kodaira, S. Hirabayashi, M. Miyasaka, S. Nebashi, and T. Shimoda: SID Int. Symp. Dig. Tech. Pap. 37 (2006) 1830.
3. T. Someya, T. Sakurai, and T. Sekitani: Int. Meet. Information Display Dig., 2006, p. 205.
4. M. P. Hong, J. H. Seo, W. J. Lee, S. G. Rho, W. S. Hong, T. Y. Choi, H. I. Jeon, S. I. Kim, B. S. Kim, Y. U. Lee, J. H. Oh, J. H. Cho, and K. Chung: SID Int. Symp. Dig. Tech. Pap. 36 (2005) 14.
5. J. Y. Kwon, D. Y. Kim, J. S. Jung, J. M. Kim, H. Lim, K. B. Park, H. S. Cho, X. Zhang, H. Yin, W. Xianyu, and T. Noguchi: Int. Meet. Information Display Dig., 2005, p. 149.
6. I. French, D. McCulloch, I. Boerefijn, and N. Kooyman: SID Int. Symp, Dig. Tech. Pap. 36 (2005) 1634.
7. C. D. Kim, I. B. Kang, and T. J. Chung: STD Int. Symp. Dig. Tech. Pap. 38 (2007) 1669.
8. T. Shimoda and S. Inoue: IEDM Tech. Dig., 1999, p. 289.
9. S. Utsunomiya, T. Kamakura, M. Kasuga, M. Kimura, W. Miyazawa, S. Inoue, and T. Shimoda: SID Int. Symp. Dig. Tech. Pap. 34 (2003) 864.
10. M. Miyasaka, H. Hara, H. Takao, S. Tam, R. Payne, P. Rajalingham, S. Inoue, and T. Shimoda: Int. Meet. Information Display Dig., 2004, p. 145.
11. S. Inoue, H. Ohshima, and T. Shimoda: Jpn. J. Appl. Phys. 41 (2002) 6313.
12. M. Miyasaka, S. Nebashi, and T. Shimoda: Int. Meet. Information Display Dig., 2006, p. 466.
13. S. Inoue: Japan Patent 3591242 (2004).
14. N. Karaki, T. Nanmoto, H. Ebihara, S. Utsunomiya, S. Inoue, and T. Shimoda: Int. Solid State Circuit Conf. Tech. Dig., 2005, p. 272.
15. M. Miyasaka, N. Karaki, and T. Shimoda: Int. Meet. Information Display Dig., 2005, p. 141.
16. M. Miyasaka: SID Int. Symp. Dig. Tech. Pap. 38 (2007) 1673.
17. H. Gleskova, S. Wagner, W. Soboyejo, and Suo: J. Appl. Phys. 92 (2002) 6224.
18. Z. Suo, E. Y. Ma, H. Gleskova, and S. Wagner: Appl. Phys. Lett. 74 (1999) 1177.
19. G. H. Gelinck, H. E. A. Huitema, E. Van Veenendaal, E. Cantatore, L. Schrijnemakers, J. B. P. H. Van Der Putten, T. C. T. Geuns, M. Beenhakkers, J. B. Giesbergs, B.-H. Huisman, E. J. Meijer, E. M. Benito, F. J. Touwslager, A. W. Marsman, B. J. E. Van Rens, and D. M. De Leeuw: Nat. Mater. 3 (2004) 106.
20. H. Sirringhaus, T. Kawase, R. H. Friend, T. Shimoda, M. Inbasekaran, W. Wu, and E. P. Woo: Science 290 (2000) 2123.
21. K. Abe, H. Kumomi, K. Nomura, T. Kamiya, M. Hirano, and H. Hosono: 14th Int. Display Workshops Dig., 2007, p. 1779.