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Volumn 114, Issue 5, 2008, Pages 1193-1200

Determination of the temperature dependent thermal expansion coefficients of bulk AlN by HRXRD

Author keywords

[No Author keywords available]

Indexed keywords

ALUMINUM NITRIDE; LATTICE CONSTANTS; X RAY DIFFRACTION; X RAY DIFFRACTION ANALYSIS;

EID: 54949096636     PISSN: 05874246     EISSN: None     Source Type: Journal    
DOI: 10.12693/APhysPolA.114.1193     Document Type: Conference Paper
Times cited : (38)

References (10)
  • 3
    • 0030284096 scopus 로고    scopus 로고
    • R.R. Reeber, K. Wang, Mater. Chem. Phys. 46, 259 (1996).
    • R.R. Reeber, K. Wang, Mater. Chem. Phys. 46, 259 (1996).
  • 6
    • 36749108587 scopus 로고    scopus 로고
    • W.M. Yim, R.J. Paff, J. Appl Phys. 45, 14561457 (1974).
    • W.M. Yim, R.J. Paff, J. Appl Phys. 45, 14561457 (1974).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.