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Volumn 47, Issue 6, 2008, Pages 1148-1160

New and simple staining method for visualizing UHMWPE lamellar structure in TEM

Author keywords

Lamellar structure; Polyethylene; Staining of ultrathin sections; Transmission electron microscopy; UHMWPE; X ray scattering

Indexed keywords

ABS RESINS; CHEMICAL MODIFICATION; DIFFERENTIAL SCANNING CALORIMETRY; ELECTRON MICROSCOPES; HEAT TREATMENT; IMAGE ANALYSIS; JOINT PROSTHESES; LASER INTERFEROMETRY; MICROSCOPIC EXAMINATION; POLYETHYLENES; SCATTERING; SULFURIC ACID; THERMOPLASTICS; ULTRAHIGH MOLECULAR WEIGHT POLYETHYLENES; WEAR RESISTANCE; X RAY SCATTERING;

EID: 54949086775     PISSN: 00222348     EISSN: 1525609X     Source Type: Journal    
DOI: 10.1080/00222340802403263     Document Type: Article
Times cited : (8)

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