Morphological study of aging phenomena in XLPE by TEM technique

Journal of Polymer Science, Part B: Polymer Physics

Volumn 34, Issue 9, 1996, Pages 1621-1628

  Fournier, Daniel ^a   Robertson, Christian ^b  

^a HYDRO QUÉBEC   (Canada)

^b ÉCOLE POLYTECHNIQUE DE MONTRÉAL   (Canada)

Author keywords

Aging; Morphology; Power cable; XLPE

Indexed keywords

AGING OF MATERIALS; CHEMICAL MODIFICATION; CROSSLINKING; DIELECTRIC MATERIALS; ELECTRIC CABLES; ELECTRIC PROPERTIES; ELECTRON BEAMS; IMAGE ANALYSIS; IMAGE ENHANCEMENT; MORPHOLOGY; RADIATION DAMAGE; TRANSMISSION ELECTRON MICROSCOPY;

CROSSLINKED POLYETHYLENE; IMAGE CONTRAST; RUTHENIUM TETROXIDE;

POLYETHYLENES;

EID: 0030189481     PISSN: 08876266     EISSN: None     Source Type: Journal    
DOI: 10.1002/(SICI)1099-0488(19960715)34:9<1621::AID-POLB11>3.0.CO;2-9     Document Type: Article

References (27)

1. H. Sano, T. Usami, and H. Nakagawa, Polymer, 27, 1497 (1986).
2. J. S. Trent, J. I. Scheinbeim, and P. R. Couchman, Macromolecules, 16, 589 (1983).
3. T. Mitsui, T. Kobayashi, H. Shimizu, S. Nagasaki, H. Matsubara, M. Kuno, H. Komatsubara, and T. Okada, Proceeding of IEEE Int. Symp. on Elec. Ins., Montréal, June 1984, pp. 22-26.
4. J. Petermann and H. Gleiter, J. Polym. Sci., Polym. Phys. Edn., 14, 555 (1976).
5. M. J. Miles and J. Petermann, J. Macromol. Sci-Phys., B16(2), 243 (1979).
6. E. J. Roche and E. L. Thomas, Polymer, 22(3), 333 (1981).
7. D. Montezinos, B. G. Wells, and J. L. Burns, J. Polym. Sci., Polym. Lett. Edn., 23, 421 (1985).
8. D. T. Grubb and A. J. Keller, J. Polym. Sci., Polym. Lett. Edn., 18, 207 (1980).
9. G. R. Strobl, M. J. Schneider, and I. G. Voigt-Martin, J. Polym. Sci., Polym. Lett. Edn., 18, 1513 (1980).
10. P. Pfluger, E. Cartier, and H. Dersh, Proceeding of IEEE Int. Symp. Electr. Ins., Boston, MA, June 1988, pp. 135-140.
11. L. Sanche, IEEE Transact. Elec. Insulation, 28(5), 789 (1993).
12. M. Marsolais, E. A. Cartier, and P. Pfluger, in Hot Electron Transport in Condensed Organic Dielectrics, J. P. Jay-Gerin and C. Ferradini, (Eds.), CRC Press, Boca Raton, 1991, Chap. 2.
13. P. J. Phillips, in Engineering Dielectrics, Vol. 2A, Electrical Properties of Solid Insulating Materials: Molecular Structure and Behavior, R. Bartnikas and R. W. Eichhorn, Eds., ASTM Special Technical Publication 783, 1983, Chap. 2, pp. 119-238.
14. D. B. Williams, in Practical Analytical Electron Microscopy in Materials Science, Electron Optics Publishing Group, Mahwah, N.J., 1984.
15. E. W. McDaniel, in Collision Phenomena in Ionized Gases, J. Wiley & Sons, New York, 1964.
16. S. M. Pimblott, J. A. La Verne, A. Mozumder, and N. J. B. Green, J. Phys. Chem., 94, 488 (1990).
17. B. Howell and D. H. Reneker, J. Appl. Polym. Sci., 40, 1663 (1990).
18. J. C. Russ, in Computer-Assisted Microscopy, Plenum Press, New York, 1990, Chap. 8, pp. 221-266.
19. Tracor Northern Corp, TN 8500 Applications software operator's manual, "Stereology," 1988.
20. J. Kleiman, W. D. Morison, Y. Gudimenko, Z. A. Iskanderova, and R. C. Tennyson, Surface Treatment of Materials and Structure by Hyperthermal Atomic Oxygen, to be published.
21. E. M. Liston, L. Martinu, and M. R. Wertheimer, J. Adhesion Sci. Technol., 7(10), 1091 (1993).
22. G. Carter, J. S. Collington, and M. J. Nobes, J. Rad. Effects, 32(2), 129 (1977).
23. G. Carter, M. J. Nobes, F. Paton, J. S. Williams, and J. L. Whitton, J. Rad. Effects, 33(2), 65 (1977).
24. M. Gamez-Garcia, R. Bartnikas, and M. R. Wertheimer, IEEE Trans. Electr. Insul, 22(2), 199 (1987).
25. S. N. Zhurkov, V. A. Zakrevskii, V. E. Korsukov, and V. S. Kuksenko, J. Polym. Sci., Part A-2, 10(8), 1509 (1972).
26. W. Xin-Sheng, T. De-Min, and L. Fu-Yi, Proceeding of Int. Symp. Elec. Ins., Baltimore, MD, June 1992, pp. 87-90.
27. B. M. Franconi, J. Appl. Phys., 54(10), 5577 (1983).