Application of transmission ellipsometry to the determination of CD spectra of porphyrin J-aggregates solid-state samples

Physica Status Solidi (A) Applications and Materials Science

Volumn 205, Issue 4, 2008, Pages 797-801

  Arteaga, O ^a   El Hachemi, Z ^a   Canillas, A ^a  

^a UNIVERSITY OF BARCELONA   (Spain)

Author keywords

[No Author keywords available]

Indexed keywords

ANISOTROPIC THIN FILMS; CD SPECTRUM; CIRCULAR BIREFRINGENCES; CIRCULAR DICHROISMS; DATA ACQUISITION SYSTEMS; LINEAR BIREFRINGENCES; MEASUREMENT METHODS; MODULATED ELLIPSOMETRIES; MUELLER MATRIX ELEMENTS; STRUCTURAL DIFFERENCES; TRANSMISSION ELLIPSOMETRIES;

AGGLOMERATION; AGGREGATES; BIREFRINGENCE; DICHROISM; ELLIPSOMETRY; PORPHYRINS; THICK FILMS;

OPTICAL PROPERTIES;

EID: 54849438967     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200777802     Document Type: Article

References (10)

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9. C. Escudero et al., J. Porphyrins Phthalocyanines 9, 852 (2005).
10. In similar films also prepared by us, CD spectra using a different optical instrumentation than that reported here, but yielding similar results, have been previously recorded by Prof. R. Kuroda group (Tokyo University). The corresponding results will be submitted soon for publication.