Structural investigation of the LaAlO3(110) surface

Thin Solid Films

Volumn 517, Issue 1, 2008, Pages 441-443

  Mortada, Hussein ^a   Derivaz, Mickael ^a   Dentel, Didier ^a   Bischoff, Jean Luc ^a  

^a UNIVERSITÉ DE HAUTE ALSACE   (France)

Author keywords

Crystal structure; High K oxides; Lanthanum aluminate; X ray photoelectron diffraction (XPD)

Indexed keywords

ATOMIC PHYSICS; ATOMS; CRYSTAL STRUCTURE; DIFFRACTION; ELECTRON DIFFRACTION; HIGH ENERGY ELECTRON DIFFRACTION; LANTHANUM; LANTHANUM ALLOYS; LOW ENERGY ELECTRON DIFFRACTION; PHOTOIONIZATION; PHOTONS; REFLECTION HIGH ENERGY ELECTRON DIFFRACTION; THREE DIMENSIONAL;

[110] DIRECTIONS; ATOMIC DISTRIBUTIONS; ATOMIC STRUCTURES; AZIMUTHAL DIRECTIONS; CORE LEVELS; CRYSTALLOGRAPHIC DIRECTIONS; HIGH-K OXIDES; LANTHANUM ALUMINATE; PARALLEL PLANES; PHOTOELECTRON DIFFRACTIONS; SCATTERING PEAKS; STRUCTURAL CHARACTERIZATIONS; STRUCTURAL INVESTIGATIONS; X-RAY PHOTOELECTRON DIFFRACTION (XPD);

CRYSTAL ATOMIC STRUCTURE;

EID: 54849415219     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.tsf.2008.08.140     Document Type: Article

References (9)

1. Deren P.J., and Krupa J.C. J. Lumin. 102/103 (2003) 386
2. Först C.J., Schwarz K., and Blöchl P.E. Phys. Rev. Lett. 95 (2005) 137602
3. Schwab R., Sporl R., Severloh P., Heidinger R., and Halbritter J. Appl. Supercond. 1/2 (1997) 61
4. Lim S.G., Kriventsov S., Jackson T.N., Haeni J.H., Schlom D.G., Balbashov A.M., Uecker R., Reiche P., Freeouf J.L., and Lucovsky G. J. Appl. Phys. 91 (2002) 4500
5. Buongiorno Nardelli M., Walker F.J., and Mc Kee R.A. Phys. Status Solidi, B Basic Res. 241 (2004) 2279
6. Gewinner G., Kafader U., Wetzel P., and Pirri C. J. Electron Spectrosc. Relat. Phenom. 67 (1994) 387
7. Simon L., Bischoff J.L., and Kubler L. Phys. Rev., B 60 (1999) 11653
8. Chambers S.A. Surf. Sci. Rep. 16 (1992) 261
9. El Kazzi M., Merckling C., Delhaye G., Arzel L., Grenet G., Bergignat E., and Hollinger G. Mater. Sci. Semicond. Process. 9 (2006) 954