Structural characterization of Fe/Ag bilayers by RBS and AFM

Nuclear Instruments and Methods in Physics Research, Section B: Beam Interactions with Materials and Atoms

Volumn 266, Issue 22, 2008, Pages 4916-4920

  Tunyogi, A ^a   Tancziko F ^a   Osvath Z ^b   Paszti F ^a  

^a WIGNER RESEARCH CENTRE FOR PHYSICS   (Hungary)

^b RESEARCH INSTITUTE FOR TECHNICAL PHYSICS AND MATERIALS SCIENCE   (Hungary)

Author keywords

Ag; Channeling; Epitaxy; Fe; RBS

Indexed keywords

ATOMIC FORCE MICROSCOPY; BACKSCATTERING; CRYSTAL GROWTH; GRAIN BOUNDARIES; MAGNETIC PROPERTIES; MAGNETIC THIN FILMS; MICROSCOPIC EXAMINATION; SEMICONDUCTING SILICON COMPOUNDS; SILICON; SILVER; SPECTROMETERS; SPECTROMETRY; THICK FILMS;

AG; CHANNELING; EPITAXY; FE; RBS;

RUTHERFORD BACKSCATTERING SPECTROSCOPY;

EID: 54549107647     PISSN: 0168583X     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.nimb.2008.07.037     Document Type: Article

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