Structure of Ag/Fe superlattices probed at different length scales

Thin Solid Films

Volumn 366, Issue 1-2, 2000, Pages 51-62

  Gladyszewski, G ^a   Temst, K ^b   Mae, K ^b   Schad, R ^b   Belien F ^b   Kunnen, E ^b   Verbanck, G ^b   Bruynseraede, Y ^b   Moons, R ^c   Vantomme, A ^c   Blasser S ^c   Langouche, G ^c  

^a LUBLIN UNIVERSITY OF TECHNOLOGY   (Poland)

^b UNIVERSITY OF LEUVEN   (Belgium)

^c KU LEUVEN   (Belgium)

Author keywords

[No Author keywords available]

Indexed keywords

ATOMIC FORCE MICROSCOPY; CHARACTERIZATION; CRYSTAL STRUCTURE; EPITAXIAL GROWTH; HIGH ENERGY ELECTRON DIFFRACTION; INTERFACES (MATERIALS); IRON; MULTILAYERS; RUTHERFORD BACKSCATTERING SPECTROSCOPY; SILVER; SURFACE ROUGHNESS; X RAY DIFFRACTION ANALYSIS;

CHANNELING SPECTROSCOPY; EPITAXIAL QUALITY; MULTILAYERED STRUCTURE;

SUPERLATTICES;

EID: 18544396915     PISSN: 00406090     EISSN: None     Source Type: Journal    
DOI: 10.1016/S0040-6090(00)00888-9     Document Type: Article

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