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Volumn 602, Issue 21, 2008, Pages 3225-3231
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Investigation of submonolayer SiOX species formed from oxidation of silane on Pt(1 1 1)
a
UCB 450
(United States)
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Author keywords
Metal insulator interface; Oxidation; Platinum; Silane
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Indexed keywords
ADSORPTION;
ATOMIC PHYSICS;
ATOMIC SPECTROSCOPY;
ATOMS;
AUGER ELECTRON SPECTROSCOPY;
CHEMICAL OXYGEN DEMAND;
CRYSTALLOGRAPHY;
DESORPTION;
ELECTRON ENERGY LOSS SPECTROSCOPY;
ELECTRON SPECTROSCOPY;
ENERGY DISSIPATION;
METAL INSULATOR BOUNDARIES;
OXIDATION;
OXYGEN;
PALLADIUM;
PHASE INTERFACES;
PLATINUM;
PLATINUM METALS;
REACTION KINETICS;
SILANES;
SILICA;
SILICON;
SILICON COMPOUNDS;
SINGLE CRYSTALS;
SURFACE REACTIONS;
TEMPERATURE PROGRAMMED DESORPTION;
THERMAL SPRAYING;
ADSORPTION AND REACTIONS;
CONSISTENT;
DESORPTION PEAKS;
DESORPTION YIELDS;
HIGH EXPOSURES;
HIGH RESOLUTION ELECTRON ENERGY LOSSES;
INITIAL STAGES;
PD(1 1 1);
SATURATED SURFACES;
SI ATOMS;
SILICON OXIDES;
SUBMONOLAYER;
SURFACE COMPOSITIONS;
SURFACE OXIDATIONS;
SURFACE SILICONS;
SURFACE SPECIES;
THERMAL TREATMENTS;
VIBRATIONAL MODES;
WATER FORMATIONS;
SURFACE STRUCTURE;
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EID: 54449086258
PISSN: 00396028
EISSN: None
Source Type: Journal
DOI: 10.1016/j.susc.2008.08.010 Document Type: Article |
Times cited : (8)
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References (42)
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