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Volumn 602, Issue 21, 2008, Pages 3225-3231

Investigation of submonolayer SiOX species formed from oxidation of silane on Pt(1 1 1)

Author keywords

Metal insulator interface; Oxidation; Platinum; Silane

Indexed keywords

ADSORPTION; ATOMIC PHYSICS; ATOMIC SPECTROSCOPY; ATOMS; AUGER ELECTRON SPECTROSCOPY; CHEMICAL OXYGEN DEMAND; CRYSTALLOGRAPHY; DESORPTION; ELECTRON ENERGY LOSS SPECTROSCOPY; ELECTRON SPECTROSCOPY; ENERGY DISSIPATION; METAL INSULATOR BOUNDARIES; OXIDATION; OXYGEN; PALLADIUM; PHASE INTERFACES; PLATINUM; PLATINUM METALS; REACTION KINETICS; SILANES; SILICA; SILICON; SILICON COMPOUNDS; SINGLE CRYSTALS; SURFACE REACTIONS; TEMPERATURE PROGRAMMED DESORPTION; THERMAL SPRAYING;

EID: 54449086258     PISSN: 00396028     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.susc.2008.08.010     Document Type: Article
Times cited : (8)

References (42)
  • 15
    • 54449093062 scopus 로고    scopus 로고
    • L.E. Davis, Handbook of Auger Electron Spectroscopy, Physical Electronics Industries, 1976.
    • L.E. Davis, Handbook of Auger Electron Spectroscopy, Physical Electronics Industries, 1976.
  • 41
    • 54449101919 scopus 로고    scopus 로고
    • D.C. Kershner, M.P. Hyman, J.W. Medlin, Surf. Sci., submitted for publication.
    • D.C. Kershner, M.P. Hyman, J.W. Medlin, Surf. Sci., submitted for publication.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.