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Volumn 4, Issue 6, 2004, Pages 618-620
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Structural characterization of Ga-doped Mg0.1Zn0.9O layers grown on ZnO/α-Al2O3 templates by P-MBE
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Author keywords
MgZnO; Molecular beam epitaxy (MBE); Transmission electron microscopy (TEM)
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Indexed keywords
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EID: 5444260734
PISSN: 15671739
EISSN: None
Source Type: Journal
DOI: 10.1016/j.cap.2004.01.032 Document Type: Article |
Times cited : (5)
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References (10)
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