Discriminatory data mapping by matrix-based supervised learning metrics

Lecture Notes in Computer Science (including subseries Lecture Notes in Artificial Intelligence and Lecture Notes in Bioinformatics)

Volumn 5064 LNAI, Issue , 2008, Pages 78-89

  Strickert, M ^a   Schneider, P ^b   Keilwagen, J ^a   Villmann, T ^c   Biehl, M ^b   Hammer, B ^d  

^a LEIBNIZ INSTITUTE OF PLANT GENETICS AND CROP PLANT RESEARCH IPK   (Germany)

^b UNIVERSITY OF GRONINGEN   (Netherlands)

^c UNIVERSITY OF LEIPZIG   (Germany)

^d CLAUSTHAL UNIVERSITY OF TECHNOLOGY   (Germany)

Author keywords

Adaptive matrix metrics; Attribute dependence modeling; LDA; Projection pursuit; Supervised feature characterization

Indexed keywords

ADAPTIVE MATRIX METRICS; ATTRIBUTE DEPENDENCE MODELING; LDA; PROJECTION PURSUIT; SUPERVISED FEATURE CHARACTERIZATION;

BACKPROPAGATION; DISCRIMINANT ANALYSIS; FEATURE EXTRACTION; GENE EXPRESSION; NETWORK PROTOCOLS; PATTERN RECOGNITION; POWER SPECTRUM; SENSOR NETWORKS; TECHNICAL PRESENTATIONS;

NEURAL NETWORKS;

EID: 54249151370     PISSN: 03029743     EISSN: 16113349     Source Type: Book Series    
DOI: 10.1007/978-3-540-69939-2_8     Document Type: Conference Paper

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