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Volumn 205, Issue 8, 2008, Pages 1835-1838

Study of cross-sections of magnetite thin films by means of electron backscatter diffraction (EBSD)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON BACKSCATTER DIFFRACTIONS; GRAIN ORIENTATIONS; GROWTH MECHANISMS; MAGNETITE FILMS; MAGNETITE LAYERS; MAGNETITE THIN FILMS; MGO SUBSTRATES; MISORIENTATION; MISORIENTATIONS; SAMPLE SURFACES;

EID: 54249128834     PISSN: 18626300     EISSN: 18626319     Source Type: Journal    
DOI: 10.1002/pssa.200723634     Document Type: Conference Paper
Times cited : (1)

References (16)
  • 7
    • 29644442254 scopus 로고    scopus 로고
    • M. Fonin et al., Phys. Rev. B 72, 104436 (2005).
    • (2005) Phys. Rev. B , vol.72 , pp. 104436
    • Fonin, M.1
  • 11
    • 54249090170 scopus 로고    scopus 로고
    • Orientation Imaging Microscopy software version V4.0, user manual, TexSEM Laboratories (TSL), Draper, UT (2004).
    • Orientation Imaging Microscopy software version V4.0, user manual, TexSEM Laboratories (TSL), Draper, UT (2004).


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.