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Journal of the American Ceramic Society

Volumn 82, Issue 6, 1999, Pages 1644-1646

SEM analysis of oxide thin films and reactions

(3) Johnson, Matthew T b Carter, C Barry b Michael, Joseph a,b

a SANDIA NATIONAL LABORATORIES (United States)

b University of Minnesota (United States)

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRON DIFFRACTION; GRAIN BOUNDARIES; IMAGING TECHNIQUES; OXIDES; SCANNING ELECTRON MICROSCOPY; SINGLE CRYSTALS; SUBSTRATES; TRANSMISSION ELECTRON MICROSCOPY;

BACKSCATTERED ELECTRON IMAGING; ELECTRON BACKSCATTERED DIFFRACTION; OXIDE FILM;

THIN FILMS;

EID: 0032647508 PISSN: 00027820 EISSN: None Source Type: Journal
DOI: 10.1111/j.1151-2916.1999.tb01981.x Document Type: Article

Times cited : (11)

References (8)

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- J. R. Michael, "All You Need to Know About Electron Backscatter Diffraction: Orientation is Only the Tip of the Iceberg"; pp. 387-88 in Microscopy and Microanalysis. Edited by G. W. Bailey, R. V. W. Dimlich, K. B. Alexander, J. J. McCarthy, and T. P. Pretlow. Springer, Cleveland, OH, 1997.
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2
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- Michael, J.R.¹

3
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4
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5
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- unpublished work
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- Johnson, M.T.¹ Gilliss, S.² Michael, J.R.³ Carter, C.B.⁴

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8
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- Johnson, M.T.¹

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