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Volumn 5024 LNCS, Issue , 2008, Pages 847-856
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Improving perception and understanding of nanoscale phenomena using Haptics and visual analogy
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Author keywords
Atomic force microscopy; Computer assisted instruction; Haptic feedback; Visual analogy
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Indexed keywords
AFM CANTILEVERS;
ATOMIC FORCES;
COMPUTER-ASSISTED INSTRUCTION;
FEEDBACK DEVICES;
GRAPHIC REPRESENTATIONS;
HAPTIC FEEDBACK;
HAPTIC FEEDBACKS;
HAPTICS;
NANOPHYSICS;
NANOSCALE;
PEDAGOGICAL TOOLS;
PRIOR KNOWLEDGES;
SPRING SYSTEMS;
VISUAL ANALOGY;
ATOMIC FORCE MICROSCOPY;
ATOMIC PHYSICS;
ATOMS;
MICROSCOPIC EXAMINATION;
NANOSTRUCTURED MATERIALS;
NANOTECHNOLOGY;
COMPUTER AIDED INSTRUCTION;
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EID: 54249126506
PISSN: 03029743
EISSN: 16113349
Source Type: Book Series
DOI: 10.1007/978-3-540-69057-3_107 Document Type: Conference Paper |
Times cited : (20)
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References (9)
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