Reliability study of single-poly floating gates in 0.13 μm CMOS for use in field programmable analog arrays

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2008, Pages 17-20

  Henrici, Fabian ^a   Peters, Christian ^a   Becker, Joachim ^a   Ortmanns, Maurits ^a   Manoli, Yiannos ^a  

^a UNIVERSITY OF FREIBURG   (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CMOS INTEGRATED CIRCUITS; HYBRID COMPUTERS; RELIABILITY;

ANALOG CONVERTERS; BEFORE AND AFTER; CHANNEL INTERFACES; CHARGE RETENTION TIMES; CMOS TECHNOLOGIES; DEEP SUBMICRON; FLICKER NOISES; FLOATING GATES; HIGH PRECISIONS; IN FIELDS;

NETWORKS (CIRCUITS);

EID: 54249118321     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2008.4616725     Document Type: Conference Paper

References (11)

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