Leakage Effects in Metal-Connected Floating-Gate Circuits

IEEE Transactions on Circuits and Systems II: Express Briefs

Volumn 53, Issue 7, 2006, Pages 577-579

  John, Ian St ^a   Fox, Robert M ^a  

^a J Crayton Pruitt Family Department of Biomedical Engineering   (United States)

Author keywords

Analog circuits; analog storage; floating gate circuits; integrated circuit (IC) reliability

Indexed keywords

ANALOG STORAGE; DIELECTRIC MATERIALS; ELECTRIC CHARGE; LEAKAGE CURRENTS; SEMICONDUCTOR DEVICE MANUFACTURE; THERMAL EFFECTS;

ANALOG CIRCUITS; FLOATING-GATE CIRCUITS; INTEGRATED CIRCUIT (IC) RELIABILITY;

GATES (TRANSISTOR);

EID: 33746394242     PISSN: 15497747     EISSN: 15583791     Source Type: Journal    
DOI: 10.1109/TCSII.2006.875317     Document Type: Article

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