Characterization of organic/metal interfaces using angle-resolved X-ray photoelectron spectroscopy

Japanese Journal of Applied Physics

Volumn 47, Issue 2 PART 2, 2008, Pages 1393-1396

  Ito, Eisuke ^a   Hara, Masahiko ^a,b  

^a Japan Science and Technology Agency   (Japan)

^b TOKYO INSTITUTE OF TECHNOLOGY   (Japan)

Author keywords

Angle resolved X ray photoelectron spectroscopy (ARXPS); Au 4f core level; Organic metal interface; P sexiphenyl; Self assembled monolayer (SAM)

Indexed keywords

CHEMISORPTION; ELECTRON ENERGY LEVELS; ELECTRON SPECTROSCOPY; ELECTRONIC PROPERTIES; ELECTRONIC STRUCTURE; EMISSION SPECTROSCOPY; F REGION; GOLD; GOLD DEPOSITS; PHOTOELECTRICITY; PHOTOELECTRON SPECTROSCOPY; PHOTOIONIZATION; PHOTONS; PHYSISORPTION; POLYMER BLENDS; SELF ASSEMBLED MONOLAYERS; SPECTRUM ANALYSIS; STRUCTURAL METALS; SUBSTRATES; SURFACE STRUCTURE;

ANGLE-RESOLVED X-RAY PHOTOELECTRON SPECTROSCOPY (ARXPS); AU 4F CORE LEVEL; ORGANIC-METAL INTERFACE; P-SEXIPHENYL; SELF-ASSEMBLED MONOLAYER (SAM);

X RAY PHOTOELECTRON SPECTROSCOPY;

EID: 54249100475     PISSN: 00214922     EISSN: 13474065     Source Type: Journal    
DOI: 10.1143/JJAP.47.1393     Document Type: Article

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