Trapped charge characterization and removal on Floating-gate transistors

Midwest Symposium on Circuits and Systems

Volumn , Issue , 2008, Pages 617-620

  Degnan, B P ^a   Hasler, P ^a   Twigg, Christopher M ^b  

^a GEORGIA INSTITUTE OF TECHNOLOGY   (United States)

^b BINGHAMTON UNIVERSITY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

CRITICAL FACTORS; FLOATING GATES; GATE TRANSISTORS; METAL CONTACTS; METAL FLOWS; TRAPPED CHARGES;

BANDPASS FILTERS; METALS; POLYSILICON; TRANSISTORS;

METAL RECOVERY;

EID: 54249086281     PISSN: 15483746     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/MWSCAS.2008.4616875     Document Type: Conference Paper

References (7)

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