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Volumn 104, Issue 7, 2008, Pages

Modeling of the evolution of dielectric loss with processing temperature in ferroelectric and dielectric thin oxide films

Author keywords

[No Author keywords available]

Indexed keywords

AMORPHOUS FILMS; BARIUM; CERAMIC CAPACITORS; CRYSTAL GROWTH; CRYSTALLINE MATERIALS; DIELECTRIC DEVICES; DIELECTRIC LOSSES; FERROELECTRIC FILMS; FERROELECTRICITY; GRAIN BOUNDARIES; GRAIN GROWTH; KETONES; THICK FILMS; THIN FILMS; TITANIUM OXIDES;

EID: 54049138001     PISSN: 00218979     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2999638     Document Type: Article
Times cited : (14)

References (13)
  • 2
    • 33847206105 scopus 로고    scopus 로고
    • 0036-8075 10.1126/science.1129564.
    • J. F. Scott, Science 0036-8075 10.1126/science.1129564 315, 954 (2007).
    • (2007) Science , vol.315 , pp. 954
    • Scott, J.F.1
  • 3
    • 29144456398 scopus 로고    scopus 로고
    • 0034-6861 10.1103/RevModPhys.77.1083.
    • M. Dawber, K. M. Rabe, and J. F. Scott, Rev. Mod. Phys. 0034-6861 10.1103/RevModPhys.77.1083 77, 1083 (2005).
    • (2005) Rev. Mod. Phys. , vol.77 , pp. 1083
    • Dawber, M.1    Rabe, K.M.2    Scott, J.F.3
  • 13
    • 0343962756 scopus 로고    scopus 로고
    • 1359-6454 10.1016/S1359-6454(99)00367-5.
    • R. Waser and R. Hagenbeck, Acta Mater. 1359-6454 10.1016/S1359-6454(99) 00367-5 48, 797 (2000).
    • (2000) Acta Mater. , vol.48 , pp. 797
    • Waser, R.1    Hagenbeck, R.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.