SCOPUS 정보 검색 플랫폼

Philosophical Magazine

Volumn 88, Issue 13-15, 2008, Pages 2103-2110

Low-energy electron diffraction (LEED) study of an aperiodic thin film of Cu on 5-fold i-Al-Pd-Mn

(7) Pussi, K a Reid, D E b Ferralis, N c McGrath, R b Lograsso, T A d Ross, A R d Diehl, R D c

a LAPPEENRANTA UNIVERSITY OF TECHNOLOGY (Finland)

b UNIVERSITY OF LIVERPOOL (United Kingdom)

c PENNSYLVANIA STATE UNIVERSITY (United States)

d IOWA STATE UNIVERSITY (United States)

Author keywords

Adsorption; Copper; Quasicrystals; Thin films

Indexed keywords

ADSORPTION; COMPUTATIONAL METHODS; DIFFRACTION; ELECTRON DIFFRACTION; LOW ENERGY ELECTRON DIFFRACTION; MANGANESE; MANGANESE ALLOYS; MANGANESE COMPOUNDS; MICROSCOPIC EXAMINATION; MODEL STRUCTURES; PALLADIUM; PERIODIC STRUCTURES; SCANNING TUNNELING MICROSCOPY; SEPARATION; SURFACE STRUCTURE; THICK FILMS; THIN FILMS;

[110] DIRECTIONS; ALPD-MN; APERIODIC ORDERS; APPROXIMANTS; CONSISTENT; CU FILMS; DO-MAINS; ENERGY ELECTRON DIFFRACTIONS; FIBONACCI SEQUENCES; NEAREST-NEIGHBOUR; PERIODIC; ROOM TEMPERATURES; SAMPLE TEMPERATURES; SCANNING TUNNELLING MICROSCOPIES; SYMMETRY DIRECTIONS;

COPPER;

EID: 54049122619 PISSN: 14786435 EISSN: 14786443 Source Type: Journal
DOI: 10.1080/14786430701832412 Document Type: Article

Times cited : (6)

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