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Physical Review Letters

Volumn 83, Issue 4, 1999, Pages 780-783

Thickness induced buckling of bcc copper films

(5) Ocko, B M a Robinson, I K b Weinert, M a Randler, R J c Kolb, D M c

a BROOKHAVEN NATIONAL LABORATORY (United States)

b University of Illinois at Urbana Champaign (United States)

c UNIVERSITY OF ULM (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

COPPER; CRYSTAL MICROSTRUCTURE; ELECTRODEPOSITION; GOLD; LATTICE CONSTANTS;

BUCKLING INSTABILITY;

METALLIC FILMS;

EID: 17344395223 PISSN: 00319007 EISSN: 10797114 Source Type: Journal
DOI: 10.1103/PhysRevLett.83.780 Document Type: Article

Times cited : (19)

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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.