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Volumn 74, Issue 3, 2006, Pages

Characterization of aperiodic and periodic thin Cu films formed on the five-fold surface of i- Al70 Pd21 Mn9 using medium-energy ion scattering spectroscopy

Author keywords

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Indexed keywords


EID: 33746653030     PISSN: 10980121     EISSN: 1550235X     Source Type: Journal    
DOI: 10.1103/PhysRevB.74.035429     Document Type: Article
Times cited : (22)

References (22)
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