Probing the surface of organic and bioconjugated nanocrystals by using mass spectrometric imaging

Chemistry - A European Journal

Volumn 14, Issue 28, 2008, Pages 8461-8464

  Min, Hyegeun ^a,b   Kim, Yongwook ^c   Yu, Hyunung ^a,b   Moon, Dae Won ^a,b   Lim, Sung Jun ^c   Yoon, Hye Joo ^c   Lee, Tae Geol ^a,b   Shin, Seung Koo ^c  

^a Korea Research Institute of Standards and Science   (South Korea)

^b University of Science and Technology (UST)   (South Korea)

^c Pohang University of Science and Technology (POSTECH)   (South Korea)

Author keywords

Bioconjugation; Mass spectrometry; Nanocrystals; Semiconductors; Surface analysis

Indexed keywords

IMAGING TECHNIQUES; MASS SPECTROMETERS; MASS SPECTROMETRY; NANOCRYSTALLINE ALLOYS; NANOCRYSTALS; NANOSTRUCTURED MATERIALS; NANOSTRUCTURES; SILICON; ZINC;

BIOCONJUGATION; ION MASS SPECTROSCOPY; SEMICONDUCTORS; SI (100) SUBSTRATE; SURFACE ANALYSIS; SURFACE LIGANDS; TIME -OF-FLIGHT; TOF-SIMS; TOF-SIMS ANALYSIS;

SECONDARY ION MASS SPECTROMETRY;

NANOPARTICLE;

ARTICLE; MASS SPECTROMETRY; METHODOLOGY; MOLECULAR PROBE; SEMICONDUCTOR;

MOLECULAR PROBES; NANOPARTICLES; SEMICONDUCTORS; SPECTROMETRY, MASS, SECONDARY ION;

EID: 53849145732     PISSN: 09476539     EISSN: 15213765     Source Type: Journal    
DOI: 10.1002/chem.200801301     Document Type: Article

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