Evolution of structure, composition, and stress in nanoporous gold thin films with grain-boundary cracks

Metallurgical and Materials Transactions A: Physical Metallurgy and Materials Science

Volumn 39, Issue 11, 2008, Pages 2656-2665

  Sun, Ye ^a   Balk, T John ^a  

^a UNIVERSITY OF KENTUCKY   (United States)

Author keywords

[No Author keywords available]

Indexed keywords

GOLD; SILVER ALLOYS; THICK FILMS; THIN FILMS;

ALLOY FILMS; AU THIN FILMS; DEALLOYING; NANO-POROUS STRUCTURE; NANOPOROUS GOLD; TIME DEPENDENCES;

SILVER;

EID: 53749099308     PISSN: 10735623     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11661-008-9625-z     Document Type: Article

References (30)

1. D. van Noort, C.F. Mandenius: Biosens. Bioelectron., 2000, vol. 15, pp. 203-09
2. Y. Ding, M.W. Chen, J. Erlebacher: J. Am. Chem. Soc., 2004, vol. 126, pp. 6876-77
3. D. Kramer, R.N. Viswanath, J. Weissmuller: Nano Lett., 2004, vol. 4, pp. 793-96
4. M.B. Cortie, A.I. Maaroof, G.B. Smith: Gold Bull., 2005, vol. 38, pp. 14-22
5. J. Erlebacher, M.J. Aziz, A. Karma, N. Dimitrov, K. Sieradzki: Nature, 2001, vol. 410, pp. 450-53
6. J. Erlebacher, K. Sieradzki: Scripta Mater., 2003, vol. 49, pp. 991-96
7. J. Erlebacher: J. Electrochem. Soc., 2004, vol. 151, pp. C614-26
8. R. Li, K. Sieradzki: Phys. Rev. Lett., 1992, vol. 68, pp. 1168-71
9. J. Biener, A.M. Hodge, A.V. Hamza, L.M. Hsiung, J.H. Satcher: J. Appl. Phys., 2005, vol. 97, pp. 024301-1-024301-4
10. A.M. Hodge, J. Biener, L.L. Hsiung, Y.M. Wang, A.V. Hamza, J.H. Satcher: J. Mater. Res., 2005, vol. 20, pp. 554-57
11. D. Lee, M.H. Zhao, X.D. Wei, X. Chen, S.C. Jun, J. Hone, E.G. Herbert, W.C. Oliver, J.W. Kysar: Appl. Phys. Lett., 2006, vol. 89, pp. 111916-1-111916-3
12. C.A. Volkert, E.T. Lilleodden, D. Kramer, J. Weissmuller: Appl. Phys. Lett., 2006, vol. 89, pp. 061920-1-061920-3
13. J.Z. Zhu, E. Seker, H. Bart-Smith, M.R. Begley, R.G. Kelly, G. Zangari, W.K. Lye, M.L. Reed: Appl. Phys. Lett., 2006, vol. 89, pp. 133104-1-133104-3
14. A.M. Hodge, J. Biener, J.R. Hayes, P.M. Bythrow, C.A. Volkert, A.V. Hamza: Acta Mater., 2007, vol. 55, pp. 1343-49
15. D. Lee, X. Wei, X. Chen, M. Zhao, S.C. Jun, J. Hone, E.G. Herbert, W.C. Oliver, J.W. Kysar: Scripta Mater., 2007, vol. 56, pp. 437-40
16. L.J. Gibson, M.F. Ashby: Cellular Solids: Structures and Properties, 2nd ed., Cambridge University Press, Cambridge, United Kingdom, 1997, p. 206
17. S. Burger, Y. Sun, F. Yang, and T.J. Balk: University of Kentucky, Lexington, KY, unpublished research, 2007
18. Y. Ding, J. Erlebacher: J. Amer. Chem. Soc., 2003, vol. 125, pp. 7772-73
19. Y. Ding, Y.J. Kim, J. Erlebacher: Adv. Mater., 2004, vol. 16, pp. 1897-900
20. S. Parida, D. Kramer, C.A. Volkert, H. Rosner, J. Erlebacher, J. Weissmuller: Phys. Rev. Lett., 2006, vol. 97, pp. 035504-1-035504-4
21. W.D. Nix: Metall. Trans. A, 1989, vol. 20A, pp. 2217-45
22. Y. Sun, T.J. Balk: Mater. Res. Soc. Symp. Proc., 2006, vol. 924, pp. Z1.2.1-6
23. N.A. Senior, R.C. Newman: Nanotechnology, 2006, vol. 17, pp. 2311-16
24. M.C. Dixon, T.A. Daniel, M. Hieda, D.M. Smilgies, M.H.W. Chan, D.L. Allara: Langmuir, 2007, vol. 23, pp. 2414-22
25. X. Lu, T.J. Balk, R. Spolenak, E. Arzt: Thin Solid Films, 2007, vol. 515, pp. 7122-26
26. Y. Sun, J. Ye, Z. Shan, A.M. Minor, T.J. Balk: JOM, 2007, vol. 59, pp. 54-58
27. B.D. Cullity, S.R. Stock: Elements of X-Ray Diffraction, 3rd ed., Prentice-Hall, Inc., Upper Saddle River, NJ, 2001, pp. 638-39
28. R.W. Balluffi, S.M. Allen, W.C. Carter: Kinetics of Materials, 1st ed., John Wiley & Sons, Inc., Hoboken, NJ, 2005, pp. 368-402
29. Y. Sun, K.P. Kucera, S.A. Burger, T.J. Balk: Scripta Mater., 2008, vol. 58, pp. 1018-21
30. L.B. Freund, S. Suresh: Thin Film Materials: Stress, Defect Formation, and Surface Evolution, 1st ed., Cambridge University Press, Cambridge, United Kingdom, 2003, pp. 197-200