Extending the possibilities in phase space analysis of synchrotron radiation x-ray optics

Applied Optics

Volumn 47, Issue 22, 2008, Pages

  Ferrero, Claudio ^a   Smilgies, Detlef Matthias ^b   Riekel, Christian ^a   Gatta, Gilles ^a   Daly, Peter ^c  

^a EUROPEAN SYNCHROTRON RADIATION FACILITY   (France)

^b Department of Obstetrics Gynecology   (United States)

^c IBM   (United Kingdom)

Author keywords

[No Author keywords available]

Indexed keywords

RAY TRACING; SYNCHROTRON RADIATION; SYNCHROTRONS;

ANALYTICAL APPROACH; EUROPEAN SYNCHROTRON RADIATION FACILITIES; MATHEMATICA- SOFTWARE; MATHEMATICAL DESCRIPTIONS; OPTICAL CALCULATIONS; PHASE-SPACE ANALYSIS; SYNCHROTRON BEAMLINES; SYNCHROTRON RADIATION X-RAYS;

PHASE SPACE METHODS;

ALGORITHM; ARTICLE; COMPUTER ASSISTED DIAGNOSIS; COMPUTER LANGUAGE; COMPUTER PROGRAM; IMAGE ENHANCEMENT; METHODOLOGY; REPRODUCIBILITY; SENSITIVITY AND SPECIFICITY; SYNCHROTRON; X RAY DIFFRACTION;

ALGORITHMS; IMAGE ENHANCEMENT; IMAGE INTERPRETATION, COMPUTER-ASSISTED; PROGRAMMING LANGUAGES; REPRODUCIBILITY OF RESULTS; SENSITIVITY AND SPECIFICITY; SOFTWARE; SYNCHROTRONS; X-RAY DIFFRACTION;

EID: 53749085654     PISSN: 1559128X     EISSN: 15394522     Source Type: Journal    
DOI: 10.1364/AO.47.00E116     Document Type: Article

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