Rare earth centers properties and electron trapping in SnO2 thin films produced by sol-gel route

Journal of Non-Crystalline Solids

Volumn 354, Issue 42-44, 2008, Pages 4840-4845

  Morais, Evandro A de ^a   Scalvi, Luis V A ^a   Cavalheiro, Alberto A ^a,b   Tabata, Américo ^a   Oliveira, José Brás B ^a  

^a SÃO PAULO STATE UNIVERSITY UNESP   (Brazil)

^b UNIVERSIDADE ESTADUAL DE MATO GROSSO DO SUL   (Brazil)

Author keywords

Conductivity; Defects; Luminescence; Photo induced effects; Tin oxide; X ray diffraction

Indexed keywords

CONDUCTIVITY; DEFECTS; LUMINESCENCE; PHOTO-INDUCED EFFECTS; TIN OXIDE; X-RAY DIFFRACTION;

RARE EARTH ELEMENTS;

EID: 53449098614     PISSN: 00223093     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.jnoncrysol.2008.04.029     Document Type: Article

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