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Volumn 91, Issue 10, 2008, Pages 3413-3415

In situ measurement of shrinkage during postreaction sintering of reaction-bonded silicon nitride

Author keywords

[No Author keywords available]

Indexed keywords

NITRIDES; SILICON NITRIDE; SINTERING;

EID: 53349160662     PISSN: 00027820     EISSN: 15512916     Source Type: Journal    
DOI: 10.1111/j.1551-2916.2008.02594.x     Document Type: Article
Times cited : (15)

References (15)
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    • Microstructure of Reaction-Bonded Silicon Nitride Fabricated under Static Nitrogen Pressure
    • D. S. Park, H. D. Kim, K. T. Lim, K. S. Bang C. Park Microstructure of Reaction-Bonded Silicon Nitride Fabricated Under Static Nitrogen Pressure Mater. Sci. Eng. A, 405, 158 62 (2005).
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    • 33746032999 scopus 로고    scopus 로고
    • Effects of Process Parameters on Post Reaction Sintering of Silicon Nitride Ceramics
    • T. Wakihara, J. Tatami, K. Komeya, T. Meguro, H. Kita, N. Kondo K. Hirao Effects of Process Parameters on Post Reaction Sintering of Silicon Nitride Ceramics Ceram. Trans., 195, 57 63 (2006).
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* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.