Using an MQE chart based on a self-organizing map NN to monitor out-of-control signals in manufacturing processes

International Journal of Production Research

Volumn 46, Issue 21, 2008, Pages 5907-5933

  Yu, J B ^a   Xi, L F ^a  

^a SHANGHAI JIAO TONG UNIVERSITY   (China)

Author keywords

Manufacturing process; Neural network; Self organizing map; Statistical process control

Indexed keywords

ARTIFICIAL INTELLIGENCE; CONFORMAL MAPPING; CONTROL THEORY; CUSTOMER SATISFACTION; ERROR ANALYSIS; FLOWCHARTING; INDUSTRIAL ENGINEERING; NETWORK PROTOCOLS; NEURAL NETWORKS; PROCESS ENGINEERING; PRODUCTION ENGINEERING; QUALITY ASSURANCE; QUALITY CONTROL; QUALITY FUNCTION DEPLOYMENT; SENSOR NETWORKS; STATISTICAL METHODS; STATISTICAL PROCESS CONTROL; TIME SERIES ANALYSIS; TOTAL QUALITY MANAGEMENT;

ABNORMAL PATTERNING; CONTROL CHARTS; MANUFACTURING PROCESS; MANUFACTURING PROCESSES; MINIMUM QUANTIZATION ERROR; MONITORING APPROACH; MULTIVARIATE PROCESSES; NEURAL NETWORK; NOISE-TOLERANCE; OUT-OF-CONTROL SIGNALS; PROCESS STATE; QUANTITATIVE ASSESSMENTS; REAL APPLICATIONS; REAL TIME; SELF-ORGANIZING; SELF-ORGANIZING MAP; STATISTICAL DISTRIBUTIONS; STATISTICAL PROCESSING; TIME-SERIES;

PROCESS CONTROL;

EID: 53349119024     PISSN: 00207543     EISSN: 1366588X     Source Type: Journal    
DOI: 10.1080/00207540701358729     Document Type: Article

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