Study of the surface contamination of copper with the improved positron annihilation-induced Auger electron spectrometer at NEPOMUC

Applied Surface Science

Volumn 255, Issue 1, 2008, Pages 220-222

  Mayer, J ^a   Hugenschmidt, C ^a   Schreckenbach, K ^a  

^a TECHNICAL UNIVERSITY OF MUNICH   (Germany)

Author keywords

Auger electrons; NEPOMUC; Positron annihilation; Surface contamination

Indexed keywords

AUGER ELECTRON SPECTROSCOPY; AUGERS; COPPER; POSITRON ANNIHILATION; POSITRONS; SIGNAL TO NOISE RATIO; SPECTROMETERS;

AUGER ELECTRON; AUGER ELECTRON SPECTROMETERS; LONG-TERM MEASUREMENTS; MEASUREMENT TIME; NEPOMUC; POLYCRYSTALLINE COPPER; POSITRON SOURCES; SURFACE CONTAMINATIONS;

ELECTRONS;

EID: 53249111479     PISSN: 01694332     EISSN: None     Source Type: Journal    
DOI: 10.1016/j.apsusc.2008.05.288     Document Type: Article

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