Modern sequential analysis and its applications to computerized adaptive testing

Psychometrika

Volumn 73, Issue 3, 2008, Pages 473-486

  Bartroff, Jay ^a   Finkelman, Matthew ^b   Lai, Tze Leung ^c  

^a UNIVERSITY OF SOUTHERN CALIFORNIA   (United States)

^b HARVARD UNIVERSITY   (United States)

^c STANFORD UNIVERSITY   (United States)

Author keywords

Computerized adaptive testing; Generalized likelihood ratio statistics; Item response theory; Mastery testing; Sequential analysis

Indexed keywords

EID: 52949118538     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11336-007-9053-9     Document Type: Article

References (26)

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