Application of sequential interval estimation to adaptive mastery testing

Psychometrika

Volumn 70, Issue 4, 2005, Pages 685-713

  Chang, Yuan Chin Ivan ^a  

^a INSTITUTE OF STATISTICAL SCIENCE   (Taiwan)

Author keywords

protection; Adaptive mastery testing; Confidence interval; Fixed proportional accuracy; Fixed width confidence interval; Indifference region; SPRT

Indexed keywords

EID: 33646429771     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11336-005-1140-9     Document Type: Article

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