On maximizing item information and matching difficulty with ability

Psychometrika

Volumn 66, Issue 1, 2001, Pages 69-77

  Bickel, Peter ^a   Buyske, Steven ^c   Chang, Huahua ^c   Ying, Zhiliang ^b  

^a UNIVERSITY OF CALIFORNIA   (United States)

^b RUTGERS UNIVERSITY   (United States)

^c NONE

Author keywords

Computerized adaptive testing; Item characteristic curve; Item information; Item response theory; Normal ogive; One parameter IRT model; Rasch model; Van Zwet tail ordering

Indexed keywords

EID: 0035532058     PISSN: 00333123     EISSN: None     Source Type: Journal    
DOI: 10.1007/BF02295733     Document Type: Article

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