E-nose vapor identification based on Dempster-Shafer fusion of multiple classifiers

IEEE Transactions on Instrumentation and Measurement

Volumn 57, Issue 10, 2008, Pages 2273-2282

  Li, Winston ^a   Leung, Henry ^a   Kwan, Chiman ^b   Linnell, Bruce R ^c  

^a UNIVERSITY OF CALGARY   (Canada)

^b Signal Processing Inc   (United States)

^c KENNEDY SPACE CENTER   (United States)

Author keywords

nearest neighbor (KNN); Dempster Shafer (DS); Electronic nose (e nose); Neural network (NN); Parzen classifier; Support vector machine (SVM); Wavelet denoising

Indexed keywords

ARTIFICIAL INTELLIGENCE; ARTIFICIAL ORGANS; CLASSIFIERS; DATA FUSION; DIELECTRIC RELAXATION; FEATURE EXTRACTION; FUSION REACTIONS; LEARNING SYSTEMS; MULTILAYER NEURAL NETWORKS; NEURAL NETWORKS; NUCLEAR PHYSICS; OBJECT RECOGNITION; PATTERN RECOGNITION SYSTEMS; SENSOR DATA FUSION; SPACE STATIONS; SUPPORT VECTOR MACHINES; VAPORS;

AIR CONTAMINANTS; CLASSIFICATION FUSION; CLASSIFICATION RATES; CLASSIFIER FUSIONS; DATA PRE-PROCESSING; DE-NOISING; DE-NOISING METHOD; DEMPSTER-SHAFER; DEMPSTER-SHAFER (DS); DEMPSTER-SHAFER FUSION; ELECTRONIC NOSE (E-NOSE); ELECTRONIC NOSES; EXPERIMENTAL ANALYSIS; MULTI-LAYER PERCEPTRONS; MULTIPLE CLASSIFIERS; NEAREST NEIGHBORS; NEURAL NETWORK (NN); PARZEN CLASSIFIER; PATTERN CLASSIFICATIONS; RANDOM NOISES; SENSOR MEASUREMENTS; SUPPORT VECTOR MACHINE (SVM); WAVELET DENOISING; WAVELET DENOISING METHOD;

CLASSIFICATION (OF INFORMATION);

EID: 52649120287     PISSN: 00189456     EISSN: None     Source Type: Journal    
DOI: 10.1109/TIM.2008.922092     Document Type: Article

References (25)

1. J. W. Gardner and P. N. Bartlett, Electronic Noses: Principles and Applications. Oxford, U.K.: Oxford Univ. Press, 1999.
2. R. C. Young, W. J. Buttner, B. R. Linnell, and R. Ramesham, "Electronic nose for space program applications," Sens. Actuators B, Chem., Vol. 93, no. 1-3, pp. 7-16, Aug. 2003.
3. T. Qian, R. Xu, C. Kwan, B. Linnell, and R. Young, "Toxic vapor classification and concentration estimation for space shuttle and international space station," in Proc. Int. Symp. Neural Netw. - Part I, Dalian, China, Aug. 2004, pp. 543-551.
4. M. A. Ryan, H. Zhou, M. G. Buehler, K. S. Manatt, V. S. Mowrey, S. P. Jackson, A. K. Kisor, A. V. Shevade, and M. L. Homer, "Monitoring space shuttle air quality using the jet propulsion laboratory electronic nose," IEEE Sensors J., Vol. 4, no. 3, pp. 337-347, Jun. 2004.
5. E. L. Hines, E. Llobet, and J. W. Gardner, "Electronic noses: A review of signal processing techniques," Proc. Inst. Electr. Eng. - Circuits, Devices Syst., Vol. 146, no. 6, pp. 297-310, Dec. 1999.
6. H. T. Nagle, R. Gutierrez-Osuna, and S. Schiffman, "The how and why of electronic noses," IEEE Spect., Vol. 35, no. 9, pp. 22-31, Sep. 1998.
7. R. Gutierrez-Osuna and H. T. Nagle, "A method for evaluating data- preprocessing techniques for odor classification with an array of gas sensors," IEEE Trans. Syst., Man, Cybern. B, Cybern., Vol. 29, no. 5, pp. 626-632, Oct. 1999.
8. O. Farooq and S. Datta, "Wavelet-based denoising for robust feature extraction for speech recognition," Electron. Lett., Vol. 39, no. 1, pp. 163-165, Jan. 2003.
9. L. Shark and C. Yu, "Denoising by optimal fuzzy thresholding in wavelet domain," Electron. Lett., Vol. 36, no. 6, pp. 581-582, Mar. 2000.
10. D. M. Wilson and S. P. DeWeerth, "Odor discrintination using steady-state and transient characteristics of tin-oxide sensors," Sens. Actuators B, Chem., Vol. 28, no. 2, pp. 123-128, Aug. 1995.
11. S. Roussel, G. Forsberg, V. Steinmetz, P. Grenier, and V. Bellon-Maurel, "Optimization of electronic nose measurements. Part I: Methodology of output feature selection," J. Food Eng., Vol. 37, no. 2, pp. 207-222, Aug. 1998.
12. L. Carmel, S. Levy, D. Lancet, and D. Harel, "A feature extraction method for chemical sensors in electronic noses," Sens. Actuators B, Chem., Vol. 93, no. 1-3, pp. 67-76, Aug. 2003.
13. R. Gutierrrez-Osuna, "Pattern analysis for machine olfaction: A review," IEEE Sensors J., Vol. 2, no. 3, pp. 189-202, Jun. 2002.
14. A. Perera, T. Sundic, A. Pardo, R. Gutierrez-Osuna, and S. Marco, "A portable electronic nose based on embedded PC technology and GNU/Linux: Hardware, software and applications," IEEE Sensors J., Vol. 2, no. 3, pp. 235-246, Jun. 2002.
15. K. Hornik, M. Stinchcombe, and H. White, "Multilayer feedforward networks are universal approximators," Neural Netw., Vol. 2, no. 5, pp. 359-366, 1989.
16. M. Pardo and G. Sberveglieri, "Remarks on the use of multilayer perceptions for the analysis of chemical sensor array data," IEEE Sensors J., Vol. 4, no. 3, pp. 355-363, Jun. 2004.
17. K. Brudzewski, S. Osowski, and T. Markiewicz, "Classification of milk by means of an electronic nose and SVM neural network," Sens. Actuators B, Chem., Vol. 98, no. 2/3, pp. 291-298, Mar. 2004.
18. K. I. Kim, K. Jung, S. H. Park, and H. J. Kim, "Support vector machines for texture classification," IEEE Trans. Pattern Anal. Mach. Intell. Vol. 24, no. 11, pp. 1542-1550, Nov. 2002.
19. R. O. Duda, P. E. Hart, and D. G. Stork, Pattern Classification. Hoboken, NJ: Wiley, 2000.
20. A. Verikas, A. Lipnickas, K. Malmqvist, M. Bacauskiene, and A. Gelzinis, "Soft combination of neural classifiers: A comparative study," Pattern Recognit. Lett., Vol. 20, no. 4, pp. 429-444, Apr. 1999.
21. Y. Lu and F. Yamaoka, "Fuzzy integration of classification results," Pattern Recognit., Vol. 30, no. 11, pp. 1877-1891, Nov. 1997.
22. L. Bruzzone, R. Cossu, and G. Vernazza, "Detection of land-cover transitions by combining multidate classifiers," Pattern Recognit. Lett., Vol. 25, no. 13, pp. 1491-1500, Oct. 2004.
23. H. Leung and J. Wu, "Bayesian and Dempster-Shafer target identification for radar surveillance," IEEE Trans. Aerosp. Electron. Syst., Vol. 36, no. 2, pp. 432-447, Apr. 2000.
24. D. Fixsen and R. P. S. Mahler, "The modified Dempster-Shafer approach to classification," IEEE Trans. Syst., Man, Cybern. A, Syst., Humans Vol. 27, no. 1, pp. 96-104, Jan. 1997.
25. Y. Hamamoto, Y. Fujimoto, and S. Tomita, "On the estimation of a covariance matrix in designing Parzen classifiers," Pattern Recognit., Vol. 29, no. 10, pp. 1751-1759, Oct. 1996.