Effect of shear mixing conditions on EMI shielding effectiveness and electrical properties of VGCNF filled thermoplastic

Technical Papers, Regional Technical Conference - Society of Plastics Engineers

Volumn 1, Issue , 2008, Pages 34-38

  Al Saleh, Mohammed H ^a   Sundararaj, Uttandaraman ^a  

^a UNIVERSITY OF ALBERTA   (Canada)

Author keywords

[No Author keywords available]

Indexed keywords

CARBON NANOFIBERS; ELASTOMERS; ELECTRIC PROPERTIES; ELECTRIC RESISTANCE; ELECTROMAGNETIC COMPATIBILITY; ELECTROMAGNETIC PULSE; ELECTROMAGNETIC SHIELDING; ELECTROMAGNETISM; MAGNETIC SHIELDING; MIXING; NANOCOMPOSITES; NANOSTRUCTURED MATERIALS; PLASTICITY; POLYMERS; RADIATION PROTECTION; RADIATION SHIELDING; SHIELDING; SPONTANEOUS EMISSION;

ELECTRICAL PROPERTIES; ELECTRICAL RESISTIVITIES; ELECTRO-MAGNETIC INTERFERENCE; EMI SHIELDING; LONG TIME; MIXING TIME; POLYETHYLENE (PE); ROTOR SPEEDS; SHEAR MIXING; SHEAR RATES; SHIELDING EFFECTIVENESS; TECHNICAL CONFERENCES; VAPOR-GROWN CARBON NANOFIBERS;

PLASTIC PRODUCTS;

EID: 52349104739     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (14)

1. J. Huang , Adv. Poly. Tech., 14(2), 137-50 (1995)
2. D. M. Bigg, In: S. Bhattacharya, Metal-filled polymers; properties and applications, Inc, New York (USA), pp 165-226 (1986).
3. M. Murthy, ANTEC, 52, 1396-1400 (1994)
4. BCC research, www.bccresearch.com, accessed July 20, 2007
5. G.G. Tibbetts, M.L. Lake, K.L. Strong and B.P. Rice, Comp. Sci. Tech, 67, 1709-1718 (2007).
6. O. Breuer, and U. Sundararaj, Poly. Comp., 25, 630-645 (2004)
7. M. Shofner, F. Rodriguez-Macias, R. Vaidyanathan, and E. Barrera, Comp.: Part A, 34, 1207-1217 (2003)
8. J. Xu, J. Donohoe, and C. Pittman, Comp.: Part A, 35, 693-701 (2004).
9. R. Andrews, D. Jacques, M. Minot, and T. Rantell, Macro. Mat. Eng., 287, 395-403 (2002)
10. E. Hammel, X. Tang, M. Trampert, T. Schmitt, K. Mauthner, A. Eder, and P. Potschke, Carbon , 42, 1153-1158 (2004).
11. K. Lozano, J. Bonilla-Rios, and E. Barrera, J. App. Poly. Sci., 80, 1162-1172 (2001 )
12. D.D.L. Chung, JMEPEG, 9, 350-354 (2000).
13. B. O. Lee, W. J. Woo, H. S. Park, H.S. Hahm, J. P. Wu, and M.S. Kim, J. Mat. Sci., 37, 1839-1843 (2002)
14. Ning Li, Yi Huang, Feng Du, Xiaobo He, Xiao Lin, Hongjun Gao, Yanfeng Ma, Feifei Li, Yongsheng Chen, and Peter C. Eklund, Nano Letters, 6, 1141-1145 (2006).