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Volumn , Issue , 2008, Pages 1092-1097

The modeling and characterization of silicon carbide thyristors

Author keywords

[No Author keywords available]

Indexed keywords

ELECTRIC SWITCHGEAR; INDUSTRIAL MANAGEMENT; MODERNIZATION; NONMETALS; PARAMETER EXTRACTION; POWER ELECTRONICS; SILICON; THYRISTORS;

EID: 52349102110     PISSN: 02759306     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/PESC.2008.4592075     Document Type: Conference Paper
Times cited : (10)

References (15)
  • 1
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    • Office of Electric Transmission and Distribution, U.S. Department of Energy, 38 pgs, March
    • G. Bindewald, "GridWorks multi-year plan," Office of Electric Transmission and Distribution, U.S. Department of Energy, 38 pgs., March 2005.
    • (2005) GridWorks multi-year plan
    • Bindewald, G.1
  • 5
    • 52349100051 scopus 로고    scopus 로고
    • J. Kassakianet.al., Principles of Power Electronics, Addison-Wesley, USA, 1992.
    • J. Kassakianet.al., "Principles of Power Electronics", Addison-Wesley, USA, 1992.
  • 6
    • 33749514226 scopus 로고    scopus 로고
    • Compact Modeling and Characterization of Silicon Carbide Power Devices,
    • PhD dissertation, Dept. Electrical Engineering, University of Arkansas, Fayetteville, AR
    • T. R. Mcnutt, "Compact Modeling and Characterization of Silicon Carbide Power Devices," PhD dissertation, Dept. Electrical Engineering, University of Arkansas, Fayetteville, AR, 2004.
    • (2004)
    • Mcnutt, T.R.1
  • 8
    • 52349086351 scopus 로고    scopus 로고
    • Material Properties and Characterization of SiC, Semiconductors and Semimetals
    • Y.S. Park, ed
    • K. Jarrendahl, and R. Davis, "Material Properties and Characterization of SiC, Semiconductors and Semimetals," SiC Materials and Devices, Vol. 52, Y.S. Park, (ed.), 1998.
    • (1998) SiC Materials and Devices , vol.52
    • Jarrendahl, K.1    Davis, R.2
  • 9
    • 52349090425 scopus 로고    scopus 로고
    • Characterization of Silicon Carbide Junction Field Effect Transistors and Metal Oxide Semiconductor Field Effect Transistors,
    • M.S. Thesis, Dept. Electrical Engineering, University of Arkansas, Fayetteville, AR
    • A. Ong, "Characterization of Silicon Carbide Junction Field Effect Transistors and Metal Oxide Semiconductor Field Effect Transistors," M.S. Thesis, Dept. Electrical Engineering, University of Arkansas, Fayetteville, AR, 2007.
    • (2007)
    • Ong, A.1
  • 11
    • 0005454681 scopus 로고
    • A physics-based model of the power diode and MOS-Controlled thyristor using the lumped charge approach
    • Ph.D. dissertation, Electrical Engineering, University of Arkansas, Fayetteville
    • Z. Hossain, "A physics-based model of the power diode and MOS-Controlled thyristor using the lumped charge approach", Ph.D. dissertation, Electrical Engineering, University of Arkansas, Fayetteville, 1994.
    • (1994)
    • Hossain, Z.1
  • 12
    • 33747596479 scopus 로고
    • Modeling of bipolar power semiconductor devices
    • Ph.D. dissertation, Electrical Engineering, University of Washington
    • C. Ma, "Modeling of bipolar power semiconductor devices", Ph.D. dissertation, Electrical Engineering, University of Washington, 1994.
    • (1994)
    • Ma, C.1
  • 15
    • 52349087501 scopus 로고    scopus 로고
    • MAST™ and Saber are registered trademarks of Synopsys Inc, Hillsboro, Oregon
    • MAST™ and Saber are registered trademarks of Synopsys Inc., Hillsboro, Oregon.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.