Photoluminescence properties of highly dispersed ZnO quantum dots in polyvinylpyrrolidone nanotubes prepared by a single capillary electrospinning

Journal of Chemical Physics

Volumn 129, Issue 11, 2008, Pages

  Li, X H ^a   Shao, C L ^a   Liu, Y C ^a   Chu, X Y ^a   Wang, C H ^a   Zhang, B X ^a  

^a NORTHEAST NORMAL UNIVERSITY   (China)

Author keywords

[No Author keywords available]

Indexed keywords

ABSORPTION; AIR POLLUTION; ELECTROSPINNING; EMISSION SPECTROSCOPY; EXCITONS; LIGHT EMISSION; LUMINESCENCE; NANOPORES; NANOSTRUCTURES; NANOTUBES; OPTICAL MICROSCOPY; OPTICAL PROPERTIES; OPTICAL WAVEGUIDES; PHOTOLUMINESCENCE; QUANTUM ELECTRONICS; SEMICONDUCTING CADMIUM TELLURIDE; SEMICONDUCTING ZINC COMPOUNDS; SPINNING (FIBERS); SURFACE DEFECTS; ZINC ALLOYS; ZINC OXIDE;

BAND GAPS; BAND-EDGE EMISSIONS; EXCITON ENERGIES; LASER THERMAL; LONGITUDINAL-OPTICAL; PHONON INTERACTIONS; PHOTOLUMINESCENCE PROPERTIES; POLY-VINYL-PYRROLIDONE; QUANTUM CONFINEMENT EFFECT; RESONANT-RAMAN SPECTRA; SCANNING AND TRANSMISSION ELECTRON MICROSCOPY; X-RAY DIFFRACTION; ZNO QUANTUM DOTS;

SEMICONDUCTOR QUANTUM DOTS;

NANOCOMPOSITE; NANOTUBE; POVIDONE; QUANTUM DOT; ZINC OXIDE;

ARTICLE; CHEMISTRY; ELECTRICITY; LUMINESCENCE; PHOTON; RAMAN SPECTROMETRY; SURFACE PROPERTY; TEMPERATURE; X RAY DIFFRACTION;

ELECTRICITY; LUMINESCENCE; NANOCOMPOSITES; NANOTUBES; PHOTONS; POVIDONE; QUANTUM DOTS; SPECTRUM ANALYSIS, RAMAN; SURFACE PROPERTIES; TEMPERATURE; X-RAY DIFFRACTION; ZINC OXIDE;

EID: 52349095228     PISSN: 00219606     EISSN: None     Source Type: Journal    
DOI: 10.1063/1.2977969     Document Type: Article

References (31)

1. Y. C. Liu, H. Y. Xu, R. Mu, D. O. Henderson, Y. M. Lu, J. Y. Zhang, D. Z. Shen, X. W. Fan, and C. W. White, Appl. Phys. Lett. 83, 1210 (2003).
2. J. G. Ma, Y. C. Liu, C. L. Shao, J. Y. Zhang, Y. M. Lu, D. Z. Shen, and X. W. Fan, Phys. Rev. B 71, 125430 (2005).
3. S. W. H. Eijt, J. de Roode, H. Schut, B. J. Kooi, and J. Th. M. De Hosson, Appl. Phys. Lett. 91, 201906 (2007).
4. K. K. Kim, N. Koguchi, Y. W. Ok, T. Y. Seong, and S. J. Park, Appl. Phys. Lett. 84, 3810 (2004).
5. J. G. Ma, Y. C. Liu, C. S. Xu, Y. X. Liu, C. L. Shao, H. Y. Xu, J. Y. Zhang, Y. M. Lu, D. Z. Shen, and X. W. Fan, J. Appl. Phys. 97, 103509 (2005).
6. Y. Y. Peng, T. E. Hsieh, and C. H. Hsu, Appl. Phys. Lett. 89, 211909 (2006).
7. H. Amekura, N. Umeda, H. Boldyryeva, N. Kishimoto, C. Buchal, and S. Mantl, Appl. Phys. Lett. 90, 083102 (2007).
8. C. H. Zang, Y. C. Liu, R. Mu, D. X. Zhao, J. G. Ma, J. Y. Zhang, D. Z. Shen, and X. W. Fan, J. Phys. D: Appl. Phys. 40, 5598 (2007).
9. X. M. Sui, C. L. Shao, and Y. C. Liu, Appl. Phys. Lett. 87, 113115 (2005).
10. X. M. Sui, C. L. Shao, and Y. C. Liu, Polymer 48, 1459 (2007).
11. Y. C. Liu, M. Y. Zhong, G. Y. Shan, Y. J. Li, B. Q. Huang, and G. L. Yang, J. Phys. Chem. B 112, 6484 (2008).
12. X. H. Li, C. L. Shao, and Y. C. Liu, Langmuir 23, 10920 (2007).
13. T. B. Du, H. W. Song, and O. Ilegbusi, Mater. Sci. Eng., C 27, 414 (2007).
14. H. X. Tang, M. Yan, X. F. Ma, H. Zhang, M. Wang, and D. R. Yang, Sens. Actuators B 113, 324 (2006).
15. L. Guo, S. H. Yang, C. L. Yang, P. Yu, J. N. Wang, W. K. Ge, and G. K. L. Wong, Appl. Phys. Lett. 76, 2901 (2000).
16. C. L. Yang, J. N. Wang, W. K. Ge, L. Guo, S. H. Yang, and D. Z. Shen, J. Appl. Phys. 90, 4489 (2001).
17. L. Spanhel and M. A. Anderson, J. Am. Chem. Soc. 113, 2826 (1991).
18. B. D. Cullity, Elements of X-ray of Diffraction (Addison-Wesley, Reading, 1978), p. 102. Since the experimental XRD pattern is so broad, for each peak, the data were fitted to a Gaussian function after subtracting the background.
19. Y. Kayanuma, Phys. Rev. B 38, 9797 (1988).
20. P. Ramvall, S. Tanaka, S. Nomura, P. Riblet, and Y. Aoyagi, Appl. Phys. Lett. 73, 1104 (1998).
21. L. Bergman, X. B. Chen, J. L. Morrison, J. Huso, and A. P. Purdy, J. Appl. Phys. 96, 675 (2004).
22. H. M. Cheng, K. F. Lin, H. C. Hsu, and W. F. Hsieh, Appl. Phys. Lett. 88, 261909 (2006).
23. C. A. Arguello, D. L. Rousseau, and S. P. S. Porto, Phys. Rev. 181, 1351 (1969).
24. X. H. Zhang, Y. C. Liu, X. H. Wang, S. J. Chen, G. R. Wang, J. Y. Zhang, Y. M. Lu, D. Z. Shen, and X. W. Fan, J. Phys.: Condens. Matter 17, 3035 (2005).
25. K. A. Alim, V. A. Fonoberov, and A. A. Balandin, Appl. Phys. Lett. 86, 053103 (2005).
26. K. A. Alim, V. A. Fonoberov, M. Shamsa, and A. A. Balandin, J. Appl. Phys. 97, 124313 (2005).
27. C. Kima, Y. J. Kim, and Y. A. Kim, Solid State Commun. 132, 567 (2004).
28. B. Xiang, P. W. Wang, X. Z. Zhang, S. A. Dayeh, D. P. R. Aplin, C. Soci, D. P. Yu, and D. L. Wang, Nano Lett. 7, 323 (2007).
29. W. T. Hsu, K. F. Lin, and W. F. Hsieh, Appl. Phys. Lett. 91, 181913 (2007).
30. V. A. Fonoberov, K. A. Alim, A. A. Balandin, F. X. Xiu, and J. L. Liu, Phys. Rev. B 73, 165317 (2006).
31. T. Makino, C. H. Chia, N. T. Tuan, Y. Segawa, M. Kawasaki, A. Ohtomo, K. Tamura, and H. Koinuma, Appl. Phys. Lett. 76, 3549 (2000).