Model systems for exploring electron correlation effects in the buckling of SiSi dimers on the Si(100) surface

Molecular Physics

Volumn 106, Issue 12-13, 2008, Pages 1697-1702

  Lampart, W M ^a   Schofield, D P ^a   Christie, R A ^a   Jordan, K D ^a  

^a UNIVERSITY OF PITTSBURGH   (United States)

Author keywords

Electron correlation effects; Electronic structure; Structure of surfaces

Indexed keywords

OLIGOMERS;

ELECTRON CORRELATION EFFECTS; ELECTRONIC STRUCTURE; MODEL SYSTEMS; SI SURFACE; STRUCTURE OF SURFACES;

SILICON;

EID: 52149121393     PISSN: 00268976     EISSN: 13623028     Source Type: Journal    
DOI: 10.1080/00268970802317504     Document Type: Article

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