A novel application of resonant tunneling devices in high performance digital circuits

Proceedings of the IEEE Conference on Nanotechnology

Volumn 2, Issue , 2003, Pages 520-523

  Ding, Li ^a   Mazumder, P ^a  

^a UNIVERSITY OF MICHIGAN   (United States)

Author keywords

Application software; Circuit noise; CMOS logic circuits; CMOS technology; Digital circuits; Energy consumption; Logic devices; Resonant tunneling devices; Semiconductor diodes; Voltage

Indexed keywords

APPLICATION PROGRAMS; CMOS INTEGRATED CIRCUITS; DIGITAL CIRCUITS; DIGITAL DEVICES; ELECTRIC POTENTIAL; ENERGY UTILIZATION; INTEGRATED CIRCUIT MANUFACTURE; INTEGRATED CIRCUITS; LOGIC DEVICES; NANOTECHNOLOGY; RESONANT TUNNELING; RESONANT TUNNELING DIODES; SEMICONDUCTOR DEVICES; SEMICONDUCTOR DIODES; TEMPERATURE MEASURING INSTRUMENTS;

CIRCUIT NOISE; CMOS LOGIC CIRCUITS; CMOS TECHNOLOGY; DIGITAL CIRCUIT APPLICATIONS; DIGITAL CIRCUIT DESIGN; NEGATIVE DIFFERENTIAL RESISTANCES; PEAK TO VALLEY CURRENT RATIO; RESONANT TUNNELING DEVICE;

LOGIC CIRCUITS;

EID: 52149118955     PISSN: 19449399     EISSN: 19449380     Source Type: Conference Proceeding    
DOI: 10.1109/NANO.2003.1230961     Document Type: Conference Paper

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