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Volumn 104, Issue 5, 2008, Pages

The role of Ca traces in the passivation of silicon dioxide dielectrics for electron transport in pentacene organic field effect transistors

(7) Benson, Niels a Gassmann, Andrea a Mankel, Eric a Mayer, Thomas a Melzer, Christian a Schmechel, Roland a Von Seggern, Heinz a

a DARMSTADT UNIVERSITY OF TECHNOLOGY (Germany)

Author keywords

[No Author keywords available]

Indexed keywords

CALCIUM; CHARGE CARRIERS; DIELECTRIC MATERIALS; ELECTRON TRANSITIONS; ELECTRON TRANSPORT PROPERTIES; ELECTRON TRAPS; ELECTRONS; MOLECULAR BEAM EPITAXY; MOLECULAR ORBITALS; MOLECULAR SPECTROSCOPY; NONMETALS; PASSIVATION; PHOTODEGRADATION; PHOTOELECTRON SPECTROSCOPY; SEMICONDUCTING ORGANIC COMPOUNDS; SILICA; SULFATE MINERALS; TRANSISTORS; TRANSPORT PROPERTIES; X RAY PHOTOELECTRON SPECTROSCOPY;

CHARGE-CARRIER TRANSPORT; ELECTRICAL STRESSING; ELECTRON CURRENTS; ELECTRON TRANSPORT; HYDROXYL GROUPS; IN DEPENDENCE; INTERFACE TRAPPING; LAYER THICKNESSES; ORGANIC FIELD EFFECT TRANSISTORS; PENTACENE; SI O2 SURFACE; SILICON DIOXIDES; TRAP DENSITIES; TRAP STATES;

FIELD EFFECT TRANSISTORS;

EID: 51849094842 PISSN: 00218979 EISSN: None Source Type: Journal
DOI: 10.1063/1.2973455 Document Type: Article

Times cited : (13)

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