Dielectric charge screening of dislocations and ionized impurities in PbSe and MCT

Journal of Electronic Materials

Volumn 37, Issue 9, 2008, Pages 1411-1414

  Elizondo, S L ^a   Zhao, F ^b   Kar, J ^b   Ma, J ^b   Smart, J ^b   Li, D ^b   Mukherjee, S ^b   Shi, Z ^b  

^a Nanolight Inc   (United States)

^b University of Oklahoma   (United States)

Author keywords

Dielectric screening; IV VI; Mid IR detector

Indexed keywords

DIELECTRIC CHARGING; DIELECTRIC SCREENING; GROWTH TECHNIQUES; IONIZED IMPURITIES; IV-VI; MID-IR DETECTOR;

LEAD;

EID: 51849094064     PISSN: 03615235     EISSN: None     Source Type: Journal    
DOI: 10.1007/s11664-008-0418-3     Document Type: Article

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