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Volumn , Issue , 2008, Pages 563-566

Improved RF-performance of sub-micron CMOS transistors by asymmetrically fingered device layout

Author keywords

Asymmetrical layout; Current density; Fingered layout; RF CMOS; Wiring capacitance

Indexed keywords

CMOS INTEGRATED CIRCUITS; DIGITAL INTEGRATED CIRCUITS; ELECTRONICS INDUSTRY; METALS; MOSFET DEVICES; OPTICAL DESIGN; RADIO WAVES; TRANSISTORS;

EID: 51849093567     PISSN: 15292517     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/RFIC.2008.4561500     Document Type: Conference Paper
Times cited : (5)

References (5)
  • 1
    • 51849101230 scopus 로고    scopus 로고
    • Extrinsic, Parasitic Capacitance Contributions of MOSFETs, their Impact on Performance, and their Modeling
    • Sept
    • J. Mueller, G. Caruyer, R. Thoma, C. Bemicot, A. Juge, "Extrinsic, Parasitic Capacitance Contributions of MOSFETs, their Impact on Performance, and their Modeling", Proc. of ESSDERC, pp. 323-326, Sept 2006.
    • (2006) Proc. of ESSDERC , pp. 323-326
    • Mueller, J.1    Caruyer, G.2    Thoma, R.3    Bemicot, C.4    Juge, A.5
  • 4
    • 33846007503 scopus 로고    scopus 로고
    • 65nm CMOS Technology for Low Power Applications
    • Dec
    • A. Steegen, R. Mo, R. Mann, et al., "65nm CMOS Technology for Low Power Applications." IEDM Tech. Dig. Papers, pp. 64-67, Dec. 2005
    • (2005) IEDM Tech. Dig. Papers , pp. 64-67
    • Steegen, A.1    Mo, R.2    Mann, R.3
  • 5
    • 34548826095 scopus 로고    scopus 로고
    • Methodology for Simultaneous Noise and Impedance Matching in W-Band LNAs
    • Nov
    • S. T. Nicolson, S. P. Voinigescu, "Methodology for Simultaneous Noise and Impedance Matching in W-Band LNAs," CSIC Dig. Tech. Papers, pp. 279-282, Nov. 2006
    • (2006) CSIC Dig. Tech. Papers , pp. 279-282
    • Nicolson, S.T.1    Voinigescu, S.P.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.