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Volumn , Issue , 2008, Pages 3-7

Sensitivity analysis to hardware Trojans using power supply transient signals

Author keywords

[No Author keywords available]

Indexed keywords

CONFIDENTIAL INFORMATION; MANUFACTURING TESTING; POWER-SUPPLY TRANSIENT; PROCESS SIMULATIONS; TROJANS; VALIDATION PROCESSES;

EID: 51849084404     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/HST.2008.4559037     Document Type: Conference Paper
Times cited : (128)

References (13)
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    • 51849136525 scopus 로고    scopus 로고
    • http://www.acq.osd.mil/dsb/reports/2005-02-HPMS_Report_Final.pdf
  • 2
    • 51849131125 scopus 로고    scopus 로고
    • http://www.darpa.mil/mto/solicitations/baa07-24/index.html
  • 3
    • 51849109048 scopus 로고    scopus 로고
    • http://www.fm.vslib.cz/~kes/asic/iscas/
  • 4
    • 51849148439 scopus 로고    scopus 로고
    • http://www.mosis.com/Technical/Testdata/tsmc-018-prm.html
  • 5
    • 18144420462 scopus 로고    scopus 로고
    • B. Yang, K. Wu, and R. Karri, Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard, in Proc. of the IEEE Int. Test Conf. (ITC), pp. 339.344, 2004.
    • B. Yang, K. Wu, and R. Karri, "Scan Based Side Channel Attack on Dedicated Hardware Implementations of Data Encryption Standard," in Proc. of the IEEE Int. Test Conf. (ITC), pp. 339.344, 2004.
  • 6
    • 2342652200 scopus 로고    scopus 로고
    • th Intl. Conf. on VLSI Design, pp. 605.611, 2004.
    • th Intl. Conf. on VLSI Design, pp. 605.611, 2004.
  • 7
    • 4444331720 scopus 로고    scopus 로고
    • P. Kocher, R. Lee, G. McGraw, A. Raghunathan, and S. Ravi, Security as a New Dimension in Embedded System Design, in Proc. of the 41st Annual Conference on Design Automation, pp. 753.760, June 2004.
    • P. Kocher, R. Lee, G. McGraw, A. Raghunathan, and S. Ravi, "Security as a New Dimension in Embedded System Design," in Proc. of the 41st Annual Conference on Design Automation, pp. 753.760, June 2004.
  • 8
    • 28444486136 scopus 로고    scopus 로고
    • K. Tiri and I. Verbauwhede, A VLSI Design Flow for Secure Side-Channel Attack Resistant ICs, in Proc. of Design, Automation and Test in Europe, pp. 58.63, Mar. 2005.
    • K. Tiri and I. Verbauwhede, "A VLSI Design Flow for Secure Side-Channel Attack Resistant ICs," in Proc. of Design, Automation and Test in Europe, pp. 58.63, Mar. 2005.
  • 10
    • 0033314416 scopus 로고    scopus 로고
    • Defect Detection using Power Supply Transient Signal Analysis, in Proc
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    • A. Germida, Z. Yan, J. Plusquellic and F. Muradali, "Defect Detection using Power Supply Transient Signal Analysis," in Proc. Int. Test Conf, pp. 67-76, Sept. 1999.
    • (1999) Int. Test Conf , pp. 67-76
    • Germida, A.1    Yan, Z.2    Plusquellic, J.3    Muradali, F.4
  • 12
    • 33748504669 scopus 로고    scopus 로고
    • D. Acharyya and J. Plusquellic, Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements, in Proc. VLSI Test Symp. (VTS'05), pp. 433-438, 2005.
    • D. Acharyya and J. Plusquellic, "Hardware Results Demonstrating Defect Detection Using Power Supply Signal Measurements," in Proc. VLSI Test Symp. (VTS'05), pp. 433-438, 2005.


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.