Pairwise testing in the presence of configuration change cost

Proceedings - The 2nd IEEE International Conference on Secure System Integration and Reliability Improvement, SSIRI 2008

Volumn , Issue , 2008, Pages 32-38

  Kimoto, Shin ^a   Tsuchiya, Tatsuhiro ^a   Kikuno, Tohru ^a  

^a OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

COMPUTER NETWORKS; COSTS; RELIABILITY;

INTERNATIONAL CONFERENCES; PAIRWISE TESTING; RELIABILITY IMPROVEMENT; SYSTEM INTEGRATION;

SOFTWARE TESTING;

EID: 51749113555     PISSN: None     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/SSIRI.2008.27     Document Type: Conference Paper

References (19)

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