A test generation strategy for pairwise testing

IEEE Transactions on Software Engineering

Volumn 28, Issue 1, 2002, Pages 109-111

  Tai, Kuo Chung ^a   Lei, Yu ^a  

^a North Carolina State University   (United States)

Author keywords

Pairwise testing; Software testing; Test generation

Indexed keywords

ALGORITHMS; AUTOMATIC TESTING; COMPUTATIONAL COMPLEXITY; COMPUTER SOFTWARE SELECTION AND EVALUATION; CURVE FITTING; GRAPHICAL USER INTERFACES; JAVA PROGRAMMING LANGUAGE; STATISTICAL METHODS;

IN-PARAMETER-ORDER; PAIRWISE TESTING; SOFTWARE TESTING; TEST GENERATION STRATEGY;

SOFTWARE ENGINEERING;

EID: 0036160958     PISSN: 00985589     EISSN: None     Source Type: Journal    
DOI: 10.1109/32.979992     Document Type: Article

References (5)

1. The combinatorial design approach to automatic test generation
2. The AETG system: An approach to testing based on combinatorial design
3. In-Parameter-Order: A test generation strategy for pairwise testing
4. Orthogonal latin squares: An application of experimental design to compiler testing
5. A practical strategy for testing pair-wise coverage of network interfaces