Using artificial life techniques to generate test cases for combinatorial testing

Proceedings - International Computer Software and Applications Conference

Volumn 1, Issue , 2004, Pages 72-77

  Shiba, Toshiaki ^a   Tsuchiya, Tatsuhiro ^b   Kikuno, Tohru ^b  

^a NTT DATA Corporation   (Japan)

^b OSAKA UNIVERSITY   (Japan)

Author keywords

[No Author keywords available]

Indexed keywords

ANT COLONY ALGORITHMS (ACA); AUTOMATIC EFFICIENT TEST GENERATORS (AETG); BINARY SEARCH; COMBINATORIAL TESTING;

BINARY SEQUENCES; GENETIC ALGORITHMS; INTERFACES (COMPUTER); PARAMETER ESTIMATION; PROBLEM SOLVING; SYSTEMS ENGINEERING;

SOFTWARE ENGINEERING;

EID: 18744401621     PISSN: 07303157     EISSN: None     Source Type: Conference Proceeding    
DOI: None     Document Type: Conference Paper

References (10)

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