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Volumn 112, Issue 34, 2008, Pages 13264-13271

Synchrotron structural characterization of electrochemically synthesized hexacyanoferrates containing K+: A revisited analysis of electrochemical redox

Author keywords

[No Author keywords available]

Indexed keywords

HEXACYANOFERRATES; STRUCTURAL CHARACTERIZATIONS;

EID: 51749105915     PISSN: 19327447     EISSN: 19327455     Source Type: Journal    
DOI: 10.1021/jp802070f     Document Type: Article
Times cited : (54)

References (53)
  • 45
    • 0000418652 scopus 로고
    • Rietveld refinement of crystal structures using powder X-ray diffraction data
    • Bish, D. L, Post, J. E, Eds. Mineralogical Society of America: Washington, D.C
    • Post, J. E.; Bish, D. L., Rietveld refinement of crystal structures using powder X-ray diffraction data. In Modern Powder Diffraction, Reviews in Mineralogy, Bish, D. L.; Post, J. E., Eds. Mineralogical Society of America: Washington, D.C., 1989; Vol. 20, pp 277-308..
    • (1989) Modern Powder Diffraction, Reviews in Mineralogy , vol.20 , pp. 277-308
    • Post, J.E.1    Bish, D.L.2


* 이 정보는 Elsevier사의 SCOPUS DB에서 KISTI가 분석하여 추출한 것입니다.