Investigation of sisal fibers by atomic force microscopy: Morphological and adhesive characteristics

Journal of Nanoscience and Nanotechnology

Volumn 6, Issue 8, 2006, Pages 2354-2361

  Leite, F L ^a,b   Herrmann, P S P ^a   Da Roz A L ^b   Ferreira, F C ^c   Curvelo, A A S ^b   Mattoso, L H C ^a  

^a EMBRAPA CERRADOS   (Brazil)

^b UNIVERSITY OF SÃO PAULO   (Brazil)

^c University of the West of São Paulo   (Brazil)

Author keywords

Adhesion; Atomic Force Microscopy; Benzylation; Composites; Force Curve; Morphology; Sisal Fibers; Wettability

Indexed keywords

ADHESION MAP; FORCE CURVE; MORPHOLOGICAL CHANGES; NANOFIBRILS;

ADHESIVES; ATOMIC FORCE MICROSCOPY; COMPOSITE MATERIALS; SURFACE CHEMISTRY;

NATURAL FIBERS;

ADHESION; BENZYLATION; HETEROGENEITY; SISAL; WETTABILITY;

ADHESIVE AGENT; NANOMATERIAL;

ADHESION; AGAVE; ARTICLE; ATOMIC FORCE MICROSCOPY; BIOPHYSICS; CELL ADHESION; CHEMISTRY; ELECTRON MICROSCOPY; METHODOLOGY; NANOTECHNOLOGY; SCANNING ELECTRON MICROSCOPY; STATISTICAL MODEL; SURFACE PROPERTY;

ADHESIONS; ADHESIVES; AGAVE; BIOPHYSICS; CELL ADHESION; MICROSCOPY, ATOMIC FORCE; MICROSCOPY, ELECTRON; MICROSCOPY, ELECTRON, SCANNING; MODELS, STATISTICAL; NANOSTRUCTURES; NANOTECHNOLOGY; SURFACE PROPERTIES;

EID: 33750165141     PISSN: 15334880     EISSN: None     Source Type: Journal    
DOI: 10.1166/jnn.2006.522     Document Type: Article

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