Electrical characterization of cross-linked ZnO nanostructures grown on Si and Si/SiO2 substrate

Sains Malaysiana

Volumn 37, Issue 3, 2008, Pages 281-283

  Fu, Dee Chang ^a   Majlis, Burhanudin Yeop ^a   Yahaya, Muhammad ^b   Salleh, Muhammad Mat ^a  

^a INSTITUTE OF MICROENGINEERING AND NANOELECTRONICS IMEN   (Malaysia)

^b UNIVERSITI KEBANGSAAN MALAYSIA   (Malaysia)

Author keywords

I V measurement; Schottky contacts; ZnO nanostructures

Indexed keywords

EID: 51649096481     PISSN: 01266039     EISSN: None     Source Type: Journal    
DOI: None     Document Type: Article

References (14)

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