Technology exploration for graphene nanoribbon FETs

Proceedings - Design Automation Conference

Volumn , Issue , 2008, Pages 272-277

  Choudhury, Mihir ^a   Yoon, Youngki ^b   Guo, Jing ^b   Mohanram, Kartik ^a  

^a Rice University   (United States)

^b University of Florida   (United States)

Author keywords

Defects; Graphene nanoribbons; Variability

Indexed keywords

DEFECTS; DESIGN AUTOMATION CONFERENCE; GRAPHENE NANORIBBON; GRAPHENE NANORIBBONS; VARIABILITY;

CIRCUIT SIMULATION; COMPUTER AIDED DESIGN; COMPUTER NETWORKS; DIGITAL INTEGRATED CIRCUITS; ENGINEERING RESEARCH; INDUSTRIAL ENGINEERING; MESFET DEVICES; QUANTUM CHEMISTRY; QUANTUM ELECTRONICS; RELIABILITY; TRANSPORT PROPERTIES;

ELECTRIC NETWORK ANALYSIS;

EID: 51549084272     PISSN: 0738100X     EISSN: None     Source Type: Conference Proceeding    
DOI: 10.1109/DAC.2008.4555822     Document Type: Conference Paper

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